High-Resolution Transmission Electron Microscopy and Associated Techniques

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Brand: OUP USA

ISBN: 9780195042757

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Description

This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopies and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, minerology,semiconductors, and metals. Contributors include:: J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. OKeefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Product Details

Brand OUP USA

Reference 83787

EAN13 9780195042757

ISBN 9780195042757

Data sheet

Publication date: 1989
Issue number: 1
Cover: hard cover
Pages count: 666
Dimensions (mm): 166 x 243
Weight (g): 1150

Imaging; Imaging theory; Elastic scattering of electrons by crystals; Elastic scattering theory; Inelastic electron scattering; Inelastic scattering II; Techniques closely related to high resolution electron microscopy; Calculation of diffraction patterns and images for Fasr electrons; Mineralogy; Contributions of high resolution electron microscopy studies to solid state chemistry; Materials science:: metals, ceramics, and semiconductors; Practical high resolution electronmicroscopy; Surfaces; Highly disordered materials

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High-Resolution Transmission Electron Microscopy and Associated Techniques

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