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Introduction to Scanning Tunneling Microscopy

Introduction to Scanning Tunneling Microscopy

9780198754756
428,22 zł
385,40 zł Zniżka 42,82 zł Brutto
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Opis
The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this bible in the field.The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basicconcepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key.Advances in this direction are presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.
Szczegóły produktu
OUP Oxford
88064
9780198754756
9780198754756

Opis

Rok wydania
2015
Numer wydania
2
Oprawa
miękka foliowana
Liczba stron
488
Wymiary (mm)
156 x 234
Waga (g)
714
  • Overview; Part I; PRINCIPLES; Tunneling Phenomena; Tunneling Matrix Elements; Atomic forces; Atomic Forces and Tunneling; Nanometer-Scale Imaging; Atomic-Scale Imaging; Nanomechanical Effects; Part II; INSTRUMENTATION; Piezoelectric Scanners; Vibration Isolation; Electronics and Control; Mechanical Design; Tip Treatment; Scanning Tunneling Spectroscopy; The Atomic Force Microscope; Illustrative Applications; APPENDICES; Greens Functions; Spherical Modified Bessel Functions; Surface symmetry; Elementary elasticity theory;
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